AFM Cantilever
Cantilever A
Shape Beam
Force Constant 48 N/m (28 - 75 N/m)*
Resonance Frequency 190 kHz (160 - 220 kHz)*
Length 225 ¦Ìm (215 - 235 ¦Ìm)*
Width 38 ¦Ìm (33 - 43 ¦Ìm)*
Thickness 7 ¦Ìm (6 - 8 ¦Ìm)*
Coating
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
Tap190Al-G
Tapping Mode AFM Probe with Long Cantilever and Aluminum Reflective Coating
AFM Probe Specifications:
AFM Tip
SHAPE
Rotated
HEIGHT
17 ¦Ìm
(15 - 19 ¦Ìm)*
SETBACK
15 ¦Ìm
(10 - 20 ¦Ìm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20¡ã-25¡ã along cantilever axis, 25¡ã-30¡ã from side, 10¡ã at the apex