CANTILEVER
ContAl-G

AFM Cantilever

Cantilever A
Shape  Beam
Force Constant 0.2 N/m (0.07 - 0.4 N/m)*
Resonance Frequency 13 kHz (9 - 17 kHz)*
Length  450 ¦Ìm (440 - 460 ¦Ìm)*
Width 50 ¦Ìm (45 - 55 ¦Ìm)*
Thickness 2 ¦Ìm (1 - 3 ¦Ìm)*


Coating

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Alignment Grooves

This product features alignment grooves on the back side of the holder chip.
ContAl-G
Contact Mode AFM Probe with Aluminum Reflective Coating

AFM Probe Specifications:


AFM Tip

SHAPE
Rotated
HEIGHT
17 ¦Ìm 
(15 - 19 ¦Ìm)*
SETBACK
15 ¦Ìm 
(10 - 20 ¦Ìm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20¡ã-25¡ã along cantilever axis25¡ã-30¡ã from side10¡ã at the apex